AUTOMATIC INSPECTION FOR ETCHING TRANSISTORS IN TFT-LCD PANEL USING BINARY TREE STRUCTURE AND BINTREE SEARCHING AND GRADIENT ORIENTATION CODE

C.-S. Lin, C.-W. Tsai, C.-M. Tseng, C.-C. Chiu, and S.-C. Chang

References

  1. [1] C.S. Lin, C.W. Tsai, Y.C. Lu, C. Tsou, & S.C. Chang, Automatic inspection of the width and gap of etching transistors in TFT-LCD panels using sub-pixel accuracy estimation, International Journal of Advanced Manufacturing Technology, 35, 2007, 127–134.
  2. [2] C.S. Lin, Y.C. Liao, Y.L. Lay, K.C. Lee, & M.S. Yeh, High-speed TFT LCD defect detection system with genetic algorithm, Assembly Automation, 28(1), 2008, 69–76.
  3. [3] C.S. Lin, J. Cho, Y.L. Lay, C.H. Lin, & N. Lin, The automeasurement of the gap of LCD glass plates using sub-pixel accuracy estimation, Optik, 117(8), 2006, 349–354.
  4. [4] J. Cho, C.S. Lin, B.J. Jan, C.H. Lin, & N.C. Chang, An opto-electrical method for measuring the gap of LCD glass plates, Optics and Laser Technology, 37(8), 2005, 623–630.
  5. [5] H.F. Ng, Automatic thresholding for defect detection, Pattern Recognition Letters, 27, 2006, 1644–1649.
  6. [6] H.V. Neto & U. Nehmzow, Visual novelty detection with automatic scale selection, Robotics and Autonomous Systems, 55, 2007, 693–701.
  7. [7] F. Pernkopf & P. O’Leary, Image acquisition techniques for automatic visual inspection of metallic surfaces, NDT&E International, 36, 2003, 609–617.
  8. [8] H. Zheng, L.X. Kong, & S. Nahavandi, Automatic inspection of metallic surface defects using genetic algorithms, Journal of Materials Processing Technology, 125–126, 2002, 427–433.
  9. [9] M.A. Patricio & D. Maravall, A novel generalization of the gray-scale histogram and its application to the automated visual measurement and inspection of wooden pallets, Image and Vision Computing, 25, 2007, 805–816.
  10. [10] J. F¨rtler, W. Krattenthaler, K.J. Mayer, H. Penz, & A. Vrabl, u SIS-Stamp: An integrated inspection system for sheet, prints in stamp printing application, Computers in Industry, 56, 2005, 958–974.
  11. [11] S.H. Lai & M. Fang, A hybrid image alignment system for fast and precise pattern localization, Real-Time Imaging, 8, 2002, 23–33.
  12. [12] H.T. Kim, C.S. Song, & H.J. Yang, 2-Step algorithm for automatic alignment in wafer dicing process, Microelectronics Reliability, 44, 2004, 1165–1179.
  13. [13] C.S. Lin, Y.L. Lay, C.C. Huan, H.C. Chang, & T.S. Hwang, An image-based LCD positioning system utilizing the modified FHT method, Optik, 114(4), 2003, 151–160.
  14. [14] H. Murase & V.V. Vinod, Fast visual search using focused color matching-active search, Systems and Computers in Japan, 31(9), 2000, 81–88.
  15. [15] K. Nakashima, Hybrid inspection system for LCD color filter panels, 10th International Conference on Instrumentation and Measurement Technology, 1994, 689–692.
  16. [16] C.S. Lin, H.C. Pu, C.H. Chen, & D.C. Chen, Using discriminate function and counting mask operation for counting spacers in liquid crystals display plate, Optik, 108(3), 1998, 133–139.
  17. [17] C.S. Lin, Y.L. Lay, C.C. Huan, H.C. Chang, & T.S. Hwang, The preprocessing and recognition methods of an integrated automated production lot number inspection system, Journal of Scientific & Industrial Research, 62, 2003, 573–582.
  18. [18] T. Kido, In-process inspection technique for active-matrix LCD panels, International Test Conference, 1992, 795–799.
  19. [19] E. Guerra & J.R. Villalobos, A three-dimensional automated visual inspection system for SMT assembly, Computers and Industrial Engineering, 40(1–2), 2001, 175–190.
  20. [20] G.A. Bilodeau & R. Bergevin, Matching graphs with fuzzy attributes in machine vision, International Journal of Robotics and Automation, 20(1), 2005, 206–277.
  21. [21] Z. Hamici, Real-time pattern recognition using circular crosscorrelation: a robot vision system, International Journal of Robotics and Automation, 21(3), 2006, 206–272.
  22. [22] C.S. Lin, K.C. Wu, Y.L. Lay, C.C. Lin, & J.M. Lin, An automatic temple generating method of the machine vision system in TFT LCD assembly and positioning process with genetic algorithm, Assembly Automation, 29(1), 2009, 41–48.
  23. [23] C.S. Lin, K.H. Huang, Y.L. Lay, K.C. Wu, Y.C. Wu, & J.M. Lin, An improved pattern match method with flexible mask for automatic inspection in the LCD manufacturing process, Expert Systems With Applications, 36, 2009, 3234–3239.

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