DWT Testing of DAC Effective Number of Bits

E. Awada and C.M. Akujuobi (USA)

Keywords

Effective Number of Bits (ENOB), Discrete Wavelet Transforms (DWT), Mixed Signal Digital-to-Analog Converters (DACs)

Abstract

In selecting Digital-to-Analog converters, overall accuracy performance is a primary concern; that is, how close does the output signal reflect the input codes. Therefore, Effective Number of Bits (ENOB) is a critical parameter specified by manufactures (directly and indirectly) to help users determining device performance and applications accuracy. In classical testing via FFT SNR, noise summation influence can misrepresent the estimation of the device active number of bits. In addition, this estimation can be complicated and lengthy. Therefore, in this work, we investigate the ability of wavelet transform to estimate ENOB with less samples in real time testing. Compared with FFT testing, our novel implementation of the wavelet transform has shortened testing times and reduced computation complexity based on the special properties of the multi-resolution process. As a result, Discrete Wavelet Transform can be especially suitable for developing a low-cost, fast testing procedure even for high resolution DACs.

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