H. Al-Asaad (USA)
Global fault collapsing, fault simulation, physical fault testing, combinational circuits.
Exact global fault collapsing can be easily applied locally at the logic gates, however, it is often ignored for large cir cuits due to its high demand of execution time and/or memory. In this paper, we present AGFC, an approximate global fault collapsing tool for combinational circuits. Experimental results show that (i) AGFC reduces the num ber of faults drastically with feasible resources and (ii) AGFC produces significantly better results than existing approaches.
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