High-Level Simulation of Substrate Noise in Mixed-Signal Integrated Circuits

M.J. Shanthi Prasad, M.N. Shanmukha Swamy, K.S. Gurumurthy (India), and B. Kim (USA)


Electrostaticanalysis, Macromodeling, Sensor, Spectre, Substrate noise.


Substrate noise caused by digital-switching activity in a mixed-signal IC can severely disturb RF circuits. This paper proposes new high-level methodology to simulate the substrate noise by extracting macromodels. The suggestions given by ITRS (international Technology Road map for semiconductors) have bee utilized by adopting the method-of-moments (MoM) and the method of Partial-Element-Equivalent-Circuit (PEEC) to extract parasitics. It has been done for several mixed-signal circuits, including large digital circuits. The necessity of doing substrate coupling analysis, particularly at microwave frequencies, has been demonstrated.

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