Thiago de Castro Martins, Renato Seiji Tavares, Jacqueline de Miranda Kian, Diego Ken Yabuki, Marcos de Sales Guerra Tsuzuki
Electrical impedance tomography, simulated annealing, fi-nite element method.
Electrical Impedance Tomography (EIT) is an imaging technique that attempts to reconstruct the conductivity dis- tribution inside an object from electrical currents and po- tentials applied and measured at its surface. The EIT recon- struction problem is approached as an optimization prob- lem. This optimization problem can be solved using Sim- ulated Annealing (SA), but at a high computational cost. To reduce the computational load, it is possible to use an incomplete evaluation of the objective function. Two objective functions are analyzed and compared: Euclid- ian distance and least square minimization. The Euclid- ian distance minimization showed to present an outside-in behavior, determining the impedance of the external ele- ments first, similar to a layer striping algorithm. It also presents the impact of using GPU for parallelizing matrix- vector multiplication. Results with experimental data are presented.
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