COMPARISON OF DIFFERENT TECHNIQUES FOR ELECTRICAL IMPEDANCE TOMOGRAPHY RECONSTRUCTION USING SIMULATED ANNEALING AND GPU PARALLELIZATION

Thiago de Castro Martins, Renato Seiji Tavares, Jacqueline de Miranda Kian, Diego Ken Yabuki, Marcos de Sales Guerra Tsuzuki

Keywords

Electrical impedance tomography, simulated annealing, fi-nite element method.

Abstract

Electrical Impedance Tomography (EIT) is an imaging technique that attempts to reconstruct the conductivity dis- tribution inside an object from electrical currents and po- tentials applied and measured at its surface. The EIT recon- struction problem is approached as an optimization prob- lem. This optimization problem can be solved using Sim- ulated Annealing (SA), but at a high computational cost. To reduce the computational load, it is possible to use an incomplete evaluation of the objective function. Two objective functions are analyzed and compared: Euclid- ian distance and least square minimization. The Euclid- ian distance minimization showed to present an outside-in behavior, determining the impedance of the external ele- ments first, similar to a layer striping algorithm. It also presents the impact of using GPU for parallelizing matrix- vector multiplication. Results with experimental data are presented.

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