O.A. Adenle and W.J. Fitzgerald (UK)
Modeling, Simulation, Signal Processing, Image Process ing
In this paper, we present an algorithm for simulating Scan ning Probe Microscope (SPM) images motivated by se quential learning algorithms for dynamic state-space mod els. The resulting algorithm comprises a series of sequen tially dependent optimisation problems allowing for spec iļ¬cation of the various parameters associated with SPM the density of the points along raster scan, probe geome try, and probe inhomogeneity. In conclusion, we present an application to simulating Scanning Electrochemical Mi croscopy.
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