L. Lado, M. Ortega, A. Fernández, and M.G. Penedo (Spain)
Local face analysis, face difference, color space, patch selection
Interest in automatic face analysis has grown in recent years due to the necessity to reinforce security measures present in our current society without decreasing user comfortability. Different approaches have been made to date, essentially unary techniques which assume the most significant locations a priori or those which give importance to regions located all over the face. Recently, local analysis based face differentiation techniques have emerged. So far, these methodologies have only been evaluated with gray scale images and few simple patch (potential characteristic regions) selection methods. This works extends a methodology of this kind by analyzing its performance with color images and different patch selection techniques, from the most simple to the most advanced keypoint localization approaches.
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