Evaluation of Garbage Collection Techniques on Flash Translation Layer

J.G. Kim, M. Choi, and S.R. Maeng (Korea)

Keywords

Embedded Systems, Flash Memory, Flash Translation Layer, Garbage Collection

Abstract

Flash memory technology is becoming more popular in designing and building embedded systems applications because of its shock-resistent, power economic, and non volatile nature. Because flash memory is a write-once and bulk-erase medium, the garbage collection mechanism on Flash Translation Layer is needed to provide applications a transparent and high bandwidth storage service. In this paper, we propose and implement a FAT-aware log-based Flash Translation Layer, which has two points of garbage collection time. We also propose two versions of victim selection policy which is to select a log block and invalidate it. The performance between the proposed victim selection policies is evaluated in terms of the effectiveness and the overhead by a series of experiments over our implemented system.

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