A Novel Parametric Test Method for Communication Systems Mixed-signal Circuits using Discrete Wavelet Transform

C.M. Akujuobi and L. Hu (USA)


Mixed-Signal Systems, Discrete Wavelet Transforms, Analog-to-Digital Converter, Testing, Effective Number of Bits.


In this paper, a novel parametric test method for communication systems mixed-signal circuits is presented. A discrete wavelet transform is applied to the response signal of the device under test (DUT). We will show that in comparison to Fourier transform methods, particular properties of this transformation are advantageous for communication systems mixed-signal test and especially built-in self test. Our test methodology is demonstrated on an Analog-to- Digital Converter (ADC). The new method can be easily implemented.

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