N.C. Kuo and A.K. Fung (USA)
method of moments, electromagnetics, backscattering, multi-scale, rough surfaces, filtering effect.
The method of moments (MoM) is applied to study back scattering from a two-scale and a three-scale rough sur faces. It is found that backscattering may or may not be sensitive to a surface roughness scale depending upon the incident frequency. As expected the large scale roughness is dominating the return at a sufficiently low frequency. What is unexpected is that at a sufficiently high frequency, it is possible for the small scale roughness to completely dominate the return so that the presence of the large scale roughness can be ignored. The simulation results are shown to compared well with IEM surface model predic tions.
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