M.Sh. Levin and M. Last (Israel)
System testing, Input-output analysis, Functional testing, Test case sequence, Combinatorial optimiza tion, Chain covering of digraph, Combinatorial algo rithms
The paper focuses on multi-function system testing in the case of multi-stage testing process. In this pa per we deal with the problem of covering a digraph of system function clusters by chains (trails) of test cases. The problem is solved by the combinatorial al gorithms which include special case algorithms (e.g., tree-like digraph); approximation-based, partitioning based, and greedy algorithms; and an algorithm based on the maximal matching. Numerical examples illus trate our approach.
Important Links:
Go Back
