Data Dependence Analysis in Automated Test Generation

B. Korel, S. Chung, and P. Apirukvorapinit (USA)

Keywords

Data dependence graph, test data generation, chaining approach, execution-oriented generation.

Abstract

Source-code based test data generation is a process of finding program input on which a selected element, e.g., a statement, is executed. The process of finding such input may be very expensive. There exist many automated test generation methods that automatically find a solution to the test generation problem. The existing methods work well for relatively simple programs. However, these methods frequently fail or are inefficient for programs with complex logic and intricate relationships between program elements. In this paper we present an approach of automated test generation in which data dependence analysis is used to guide the search process. Our initial experience with the approach shows that the approach may efficiently find solutions to the test generation problems.

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