C.M. Akujuobi and L. Hu (USA)
Discrete Wavelet Transforms, Analog-to-DigitalConverter, Testing, Gain Error, Offset Error.
The wavelet transform-based technique for static testing of Mixed-Signal systems is discussed in this paper. The specific mixed-signal system of interest is an Analog to- Digital Converter (ADC). We implement a discrete wavelet transform to the response signal of the device under test (DUT). We used two types of wavelets for this work and compared their results as to which one gave us the best result. The technique applied here can also be extended to the testing of Digital-To-Analog Converters (DACs). The new method can be easily implemented.
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